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IEEE科技文献引领全球半导体行业发展  
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IEEE科技文献引领全球半导体行业发展
 
IEEE科技文献代表全球最新最前沿研发动态,其跨学科、多学科的研究成果与解决方案将进一步激发科研机构产生新的创意与想法,从而转化为创新专利与新型产品。
 
2013年,1790 Analytics LLC针对专利申请量最多的25家全球著名高科技企业的研究表明,IEEE科技文献被其专利申请文档的引用量排名第一
•        领先于其他同类科技出版社3倍之多
•        1997年以来专利对IEEE文献的引用量增长了660%
•        科技文献对专利的重要性日趋增大
•        IEEE科技文献对科技创新者的价值越来越大
 
IEEE科技文献主要涉及多个核心领域,在半导体行业,IEEE始终引领着整个行业的发展:
 
半导体行业专利对IEEE科技文献的引用情况:



半导体行业著名高科技企业对IEEE文献的引用情况:



IEEE关于半导体行业的文献资料:



IEEE关于半导体行业的期刊列举:
 
•       IEEE Transactions on Electron Devices
•       IEEE Photonics Technology Letters
•       IEEE Journal of Quantum Electronics
•       IEEE Transactions on Semiconductor Manufacturing
•       IEEE Solid-State Circuits Magazine
•       IEEE Journal of Solid-State Circuits
 
IEEE关于半导体行业的会议列举:
 
•       IEEE International Conference on Semiconductor Electronics
•       IEEE International Semiconductor Laser Conference
•       IEEE Semiconductor Thermal Measurement and Management Symposium
•       IEEE Symposium on Compound Semiconductor Integrated Circuit
•       IEEE Symposium on Semiconductor Thermal Measurement and Management
•       IEEE/SEMI Conference and Workshop Advanced Semiconductor Manufacturing
•       International Conference on Advanced Semiconductor Devices and Microsystems
•       International Conference on Advanced Thermal Processing of Semiconductors
•       International Conference on Semiconductor Laser and Photonics
•       International Semiconductor Conference
•       International Semiconductor Device Research Symposium
•       International Symposium on Power Semiconductor Devices and ICs
•       International Symposium on Semiconductor Device Research
•       International Symposium on Semiconductor Manufacturing
 
IEEE关于半导体行业的标准列举:
 
IEEE 592-2007   Standard for Exposed Semiconducting Shields on High-Voltage
Cable Joints and Separable Connectors
IEEE 1450.1-2005   Standard for Extensions to Standard Test Interface Language
(STIL) (IEEE Std 1450 /SUP TM/ 1999) for Semiconductor Design Environments
IEC 62526 edition 1.0 2007 Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
IEEE C57.18.10-1998   Standard Practices and Requirements for Semiconductor Power
Rectifier Transformers
IEEE C62.35-2010   Standard Test Methods for Avalanche Junction Semiconductor
Surge-Protective Device Components
N42.31-2003   American National Standard for Measurement Procedures for
Resolution and Efficiency of Wide-Band Gap Semiconductor Detectors of Ionizing Radiation
 
客户列举:
IEEE已与半导体行业多家顶尖机构开展深度合作,代表机构有:



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